Ushwankathelo
Yipakethe tester ebanzi esetyenziswe kuvavanyo lweempawu ezisisiseko zepakethe yebhetri ye-Li-ion kunye nokukhuselwa kwe-IC (ukuxhasa i-I2C, i-SMBus, iinkqubo zonxibelelwano ze-HDQ).
Basic Famandla TEst
• Umbane wesekethe ovulekileyo
• Ukulayisha ombane
• Uvavanyo lomthwalo onamandla
Uvavanyo lwe-ACIR;
Uvavanyo lwe-THR
Uvavanyo lwe-IDR
Uvavanyo oluqhelekileyo lokutshaja ombane
• Uvavanyo lwamandla ombane aqhelekileyo
• Uvavanyo lomthamo
• Uvavanyo lokuvuza
• I-IDR / THR kunye nolawulo lokuvavanya amandla okusebenza
Uvavanyo lweMpawu zoKhuseleko
Ngaphezulu kovavanyo lwangoku lokhuselo: ukutshaja ngaphezulu komsebenzi wokhuselo wangoku, ixesha lokulibaziseka kukhuselo kunye novavanyo lomsebenzi wokubuyisela
Amagqabantshintshi:
Ukucaciswa:
Isalathiso |
Ukucaciswa |
Ukuchaneka |
Ombane Open-wesekethe |
I-0.1 V 10V |
± (0.01% RD + 0.05% FS) |
Uvavanyo lwe-ACIR |
0 ~ 1250 mΩ |
± (0.15% RD + 1 mΩ) |
Uvavanyo lwe-THR |
200 ~ 1m |
± (0.1% RD + 100Ω) |
1M ~ 3M |
± (0.1% RD + 500Ω) |
|
Uvavanyo lwe-IDR |
200 ~ 1m |
± (0.1% RD + 100Ω) |
1M ~ 3M |
± (0.1% RD + 500Ω) |
|
Ukutshaja ngokwesiqhelo uvavanyo lwangoku (Ukutshaja ngaphezulu kwexesha langoku ukhuseleko kunye nokulibaziseka kukhuseleko) |
0.1 ~ 2A |
± (0.01% RD + 0.05% FS) |
2, 30A |
± (0.01% RD + 0.02% FS) |
|
Ukukhupha uvavanyo oluqhelekileyo lwangoku (ukukhusela ngaphezulu kwangoku kukhuseleko kunye nokulibaziseka kukhuseleko) |
0.1 ~ 2A |
± (0.01% RD + 0.5mA) |
2, 30A |
± (0.02% RD + 0.5mA) |
|
Uvavanyo lomthamo |
0.1 ~ 10 uF |
± (5% RD + 0.05uF) |
Uvavanyo lokhuselo olufutshane (kufezekiswe ngokulibaziseka kokhuseleko) |
2, 30A |
± (0.02% RD + 0.5mA) |